| BODY HEIGHT | 0.100 INCHES MINIMUM AND 0.120 INCHES MAXIMUM |
| BODY LENGTH | 0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM |
| BODY WIDTH | 0.438 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| CASE OUTLINE SOURCE AND DESIGNATOR | C-12 MIL-M-38510 |
| CRITICALITY CODE JUSTIFICATION | FEAT |
| FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND RADIATION HARDENED AND SELECTED ITEM AND MONOLITHIC AND ERASABLE AND TESTED TO MIL-STD-883 AND W/ENABLE AND PROGRAMMABLE |
| INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| INCLOSURE MATERIAL | CERAMIC |
| MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
| MEMORY DEVICE TYPE | EEPROM |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS |
| OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUITS,DIGITAL,NMOS,8K X 8 EEPROM,MONOLITHIC SILICON; MICROCIRCUIT,DIGITAL,ELECTRICALLY ERASABLE PROM (8K X 8) |
| SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM,MONOLITHIC SILICON,NMOS FLOATING GATE,64K-BIT,5V ELEC ERASABLE/PROGRAMMABLE EEPROM,ORIG PN 5962-8683004YX |
| SPECIAL TEST FEATURES | RADIATION ACCEPTANCE TEST |
| STORAGE TEMP RANGE | -65.0 TO 150.0 CELSIUS |
| TERMINAL SURFACE TREATMENT | SOLDER |
| TERMINAL TYPE AND QUANTITY | 32 LEADLESS |
| TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM ACCESS |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM TOTAL SUPPLY AND 6.0 VOLTS MAXIMUM TOTAL SUPPLY |