| CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
| CRITICALITY CODE JUSTIFICATION | FEAT |
| CURRENT RATING PER CHARACTERISTIC | 100.00 MILLIAMPERES MAXIMUM OUTPUT SINK |
| FEATURES PROVIDED | PROGRAMMED |
| HYBRID TECHNOLOGY TYPE | MONOLITHIC |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| INCLOSURE MATERIAL | CERAMIC |
| INPUT CIRCUIT PATTERN | 14 INPUT |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROM,PROGRAMMED (8192 WORD X 8-BIT) |
| PROPRIETARY CHARACTERISTICS | CXCY AND ZZZK AND ZZZT |
| MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
| MEMORY DEVICE TYPE | PROM |
| NONDEFINITIVE SPEC/STD DATA | 3 NUMBER |
| OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
| SPECIAL FEATURES | NUCLEAR HARDNESS CRITICAL ITEM |
| SPECIAL TEST FEATURES | PROGRAMMED PER FIRMWARE NO. "754173" |
| SPECIFICATION/STANDARD DATA | 99167-755255 MANUFACTURERS SOURCE CONTROL |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM APPLIED AND 7.0 VOLTS MAXIMUM APPLIED AND -1.5 VOLTS MINIMUM ABSOLUTE INPUT AND 5.5 VOLTS MAXIMUM ABSOLUTE INPUT AND 4.5 VOLTS MINIMUM POSITIVE POWER SUPPLY SPAN AND 5.5 VOLTS MAXIMUM POSITIVE POWER SUPPLY SPAN |
| STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| TERMINAL SURFACE TREATMENT | SOLDER |
| TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). AND 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TIME RATING PER CHACTERISTIC | 50.00 NANOSECONDS NOMINAL ACCESS |