CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
CURRENT RATING PER CHARACTERISTIC | 100.00 MILLIAMPERES MAXIMUM OUTPUT SINK |
DEPARTURE FROM CITED DESIGNATOR | ALTERED BY PROGRAMMING,TESTING & MARKING |
FEATURES PROVIDED | PROGRAMMED AND SCHOTTKY AND HIGH IMPEDANCE |
HYBRID TECHNOLOGY TYPE | MONOLITHIC |
INCLOSURE CONFIGURATION | DUAL-IN-LINE |
INCLOSURE MATERIAL | CERAMIC |
MAXIMUM POWER DISSIPATION RATING | 1.02 WATTS |
MEMORY DEVICE TYPE | PROM |
OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS |
OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,DIGITAL,16,384 BIT SCHOTTKY,BIPOLAR PROM |
PURCHASE DESCRIPTION IDENTIFICATION | 04939-717744154-009 |
SPECIFICATION/STANDARD DATA | 81349--38510/21002BJA GOVERNMENT SPECIFICATION |
STORAGE TEMP RANGE | -65.0 TO 150.0 CELSIUS |
TERMINAL SURFACE TREATMENT | SOLDER |
TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). AND 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
TIME RATING PER CHACTERISTIC | 100.00 NANOSECONDS NOMINAL ACCESS AND 50.00 NANOSECONDS NOMINAL ACCESS |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -1.5 VOLTS MINIMUM ABSOLUTE INPUT AND 5.5 VOLTS MAXIMUM ABSOLUTE INPUT |